Self-Cascode Current-Voltage Curve-Construction Algorithm from Single MOSFET Measurements for Analog Figures-of-Merit Extraction

Martins d’Oliveira, Ligia;Kilchytska, Valeriya;Flandre, Denis;de Souza, Michelly
(2019) Journal of Integrated Circuits and Systems — Vol. 14, n° 1, p. 6 (2019)

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Authors
  • Martins d’Oliveira, LigiaEletrical Engineering Department, Centro Universitário FEI, São Bernardo do Campo - Brazil
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  • Kilchytska, ValeriyaUCLouvain
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  • Flandre, DenisUCLouvain
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  • de Souza, MichellyEletrical Engineering Department, Centro Universitário FEI, São Bernardo do Campo - Brazil
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Abstract
This paper proposes a curve extraction method for I-V curves and analog figures-of-merit of self-cascode MOSFET associations (SC) using a code that exploits I-V curves of single transistors as input. The method was validated by using experimental measurements of fabricated SC and the very single transistors that compose them. The results indicate a very low error between the SC generated by the code and the measured reference for operation in saturation regime and above threshold voltage, for both the I-V curves and their derivatives. This method is then valid for the assessment of the SC structures in new technologies, avoiding experimental dedicated layouts or complex setups.
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Martins d’Oliveira, L., Kilchytska, V., Flandre, D., & de Souza, M. (2019). Self-Cascode Current-Voltage Curve-Construction Algorithm from Single MOSFET Measurements for Analog Figures-of-Merit Extraction. Journal of Integrated Circuits and Systems, 14(1), 6. https://doi.org/10.29292/jics.v14i1.69 (Original work published 2019)