Variance and Skewness of Current Fluctuations Experimentally Evidenced in Single-Photon Avalanche Diodes

Van Brandt, Léopold;Vercauteren, Roselien;Haya Enriquez, Diego;André, Nicolas;Delvenne, Jean-Charles;et.al.
(2023) 2023 International Conference on Noise and Fluctuations (ICNF) — Location: Grenoble, France (17.October.2023)

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Abstract
Consistently with recently published theoretical work, we experimentally demonstrate that, in electronic devices exhibiting strongly nonlinear current-voltage characteristics, the white noise cannot be purely Gaussian, as predicted by the stochastic thermodynamic relations. Micro-fabricated silicon single-photon avalanche diodes exemplify this result. Relying on high-accuracy time-domain noise measurements, we go beyond the conventional characterization of fluctuations in terms of mean and variance only by also assessing the third moment (skewness).
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Van Brandt, L., Vercauteren, R., Haya Enriquez, D., André, N., Kilchytska, V., Flandre, D., & Delvenne, J.-C. (2023). Variance and Skewness of Current Fluctuations Experimentally Evidenced in Single-Photon Avalanche Diodes. 2023 International Conference on Noise and Fluctuations (ICNF). Published. 2023 International Conference on Noise and Fluctuations (ICNF), Grenoble, France. https://doi.org/10.1109/ICNF57520.2023.10472747