Parametric Modeling for Improved Die Area Estimation in the Life Cycle Assessment of Electronic SystemsWattiez, Augustin;Dethienne, Robin;Collin, Anne-Sophie;Bol, David(2024) Electronics Goes Green 2024+ — Location: Berlin (18.June.2024)
Filesegg24_proceedings-217.pdf Extended abstract Open Access Adobe PDF231.55 KBDownloadEGG_2024.pdf Presentation slides Open Access Adobe PDF3.33 MBDownloadDetailsAuthorsWattiez, AugustinUCLouvainAuthorDethienne, RobinUCLouvainAuthorCollin, Anne-SophieUCLouvainAuthorBol, DavidUCLouvainAuthorAffiliationsUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueShow moreCitations APA Chicago FWB Wattiez, A., Dethienne, R., Collin, A.-S., & Bol, D. (2024). Parametric Modeling for Improved Die Area Estimation in the Life Cycle Assessment of Electronic Systems. Electronics Goes Green 2024+, Berlin. https://hdl.handle.net/2078.5/256537