Defect Engineering in n-Type Oxide Semiconductor TFTs

Li, Guoli;He, Jiawei;Flandre, Denis;Liao, lei

Files

DefectEngineeringinn-TypeoxideSemiconductorTFTs.pdf
  • Open Access
  • Adobe PDF
  • 1.06 MB
Download

Details

Authors
  • Li, GuoliSchool of Physics and Electronics, Hunan University, Changsha/China
    Author
  • He, JiaweiSchool of Physics and Technology, Wuhan University, Wuhan/China
    Author
  • Flandre, DenisUCLouvain
    Author
  • Liao, leiSchool of Physics and Electronics, Hunan University, Changsha/China
    Author
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Li, G., He, J., Flandre, D., & Liao, l. (2020). Defect Engineering in n-Type Oxide Semiconductor TFTs. International Conference on Display Technology 2020, Wuhan (China). https://hdl.handle.net/2078.5/253342