Scaling Trends for Dual-Rail Logic Styles against Side-Channel Attacks: a Case-Study
(2017) 8th International Workshop on Constructive Side-Channel Analysis and Secure Design (COSADE 2017) — Location: Paris (France) (13.April.2017)
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- Abstract
- Dual-rail logic styles have been considered as possible alternatives to CMOS for the design of cryptographic circuits (more) secure against side-channel attacks. The state-of-the-art view on this approach is contrasted as they reduce the exploitable side-channel signal while not being sufficient to fully prevent the attacks. Since the limitations of dual-rail logic styles are essentially due to implementation challenges (e.g. the need of well-balanced capacitances), a natural question is to find out how they evolve with technology scaling. In this paper, we discuss this issue based on the relevant case study of an AES S-box implemented in CMOS and a dual-rail logic style, for two (65 nanometer and 28 nanometer) technologies. Our evaluations show that the security vs. performance tradeoff of our dual-rail logic style does not scale well compared to CMOS. It also shows that the scaling trends for CMOS are more positive (i.e. smaller technologies and supply voltages reduce the energy consumption and the side-channel signal). So these results suggest that dual-rail logic style may not be a sustainable approach for side-channel signal reduction as we move towards lower technology nodes.
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Nawaz, K., Kamel, D., Standaert, F.-X., & Flandre, D. (2017). Scaling Trends for Dual-Rail Logic Styles against Side-Channel Attacks: a Case-Study. In Sylvain Guilley (ed.), Proceedings of the 8th International Workshop on Constructive Side-Channel Analysis and Secure Design (COSADE 2017) (p. p. 19-33). Springer. https://hdl.handle.net/2078.5/227446