Defect Engineering in n-Type Oxide Semiconductor TFTs

Li, Guoli;He, Jiawei;Flandre, Denis;Liao, lei
(2020) International Conference on Display Technology 2020 — Location: Wuhan (China) (29.March.2020)

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  • Li, GuoliSchool of Physics and Electronics, Hunan University, Changsha/China
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  • He, JiaweiSchool of Physics and Technology, Wuhan University, Wuhan/China
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  • Flandre, DenisUCLouvain
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  • Liao, leiSchool of Physics and Electronics, Hunan University, Changsha/China
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Li, G., He, J., Flandre, D., & Liao, l. (2020). Defect Engineering in n-Type Oxide Semiconductor TFTs. International Conference on Display Technology 2020, Wuhan (China). https://hdl.handle.net/2078.5/253342