DC-40 GHz SPDTs in 22 nm FD-SOI and back-gate impact study
(2020) The 2020 IEEE Radio Frequency Integrated Circuits Symposium – RFIC 2020 — Location: Los Angeles (USA) (4.August.2020)
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DC-40GHzSPDTsin22nmFD-SOIandback-gateimpactstudy.pdf
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Rack, M., Nyssens, L., Wane, S., Bajon, D., & Raskin, J.-P. (2020). DC-40 GHz SPDTs in 22 nm FD-SOI and back-gate impact study. The 2020 IEEE Radio Frequency Integrated Circuits Symposium – RFIC 2020, Los Angeles (USA). https://hdl.handle.net/2078.5/228301