Substrate RF non-linear characterization and modeling

Rack, Martin;Allibert, Frédéric;Raskin, Jean-Pierre
(2021) 5th Sino MOS-AK Workshop Xi’an (MOS-AK: Modeling of Systems and Parameter Extraction Working Group) — Location: Xi’an, China (11.August.2021)

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Rack, M., Allibert, F., & Raskin, J.-P. (2021). Substrate RF non-linear characterization and modeling. 5th Sino MOS-AK Workshop Xi’an (MOS-AK: Modeling of Systems and Parameter Extraction Working Group), Xi’an, China. https://hdl.handle.net/2078.5/229450