Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach
(2017) Micron — Vol. 94, p. 66-73 (2017)
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- Authors
- Abstract
- Twin-jet electro-polishing and Focused Ion Beam (FIB) were combined to produce small size Nickel single crystal specimens for quantitative in-situ nanotensile experiments in the transmission electron micro-scope. The combination of these techniques allows producing samples with nearly defect-free zones in the centre in contrast to conventional FIB-prepared samples. Since TEM investigations can be performed on the electro-polished samples prior to in-situ TEM straining, specimens with desired crystallographic orientation and initial microstructure can be prepared. The present results reveal a dislocation nucleation-controlled plasticity, in which small loops induced by FIB near the edges of the samples play a central role.
- Affiliations
University of Antwerp EMAT Karlsruhe Institute of Technology (KIT) Institute for Applied Materials
Citations
Samaeeaghmiyoni, V., Idrissi, H., Groten, J., Schwaiger, R., & Schryvers, D. (2017). Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach. Micron, 94, 66-73. https://doi.org/10.1016/j.micron.2016.12.005 (Original work published 2017)