An in-depth analysis of temperature effect on DIBL in UTBB FD SOI MOSFETs based on experimental data, numerical simulations and analytical models

Pereira, A.S.N.; de Streel, Guerric; Planes, N.; Haond, M.; Giacomini, R.; Flandre, Denis; Kilchytska, Valeriya

doi:10.1016/j.sse.2016.10.017

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