Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga(+) and C(60)(+) Projectiles.

Wehbe, Nimer; Mouhib, Taoufiq; Prabhakaran Nair Syamala Amma, Aneesh; Bertrand, Patrick; Delcorte, Arnaud

doi:10.1016/j.jasms.2009.08.022

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