Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films
(2013) Microscopy and Microanalysis — Vol. 19, n° 3, p. 693-697 (2013)
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- Abstract
- A new automated crystallographic orientation mapping tool in a transmission electron microscopie technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstrutures.
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Citations
Galceran, M., Albou, A., Renard, K., Coulombier, M., Jacques, P., & Godet, S. (2013). Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films. Microscopy and Microanalysis, 19(3), 693-697. https://doi.org/10.1017/S1431927613000445 (Original work published 2013)