Measurement of Intrinsic Gate Capacitances of Soi Mosfets
(1990) IEEE Electron Device Letters — Vol. 11, n° 7, p. 291-293 (1990)
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Flandre, D., Vandewiele, F., Jespers, PGA., & Haond, M. (1990). Measurement of Intrinsic Gate Capacitances of Soi Mosfets. IEEE Electron Device Letters, 11(7), 291-293. https://doi.org/10.1109/55.56478 (Original work published 1990)