Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity

Bertrand, Patrick;Delcorte, Arnaud
(2006) American Chemical Society. Abstracts of Papers (at the National Meeting) — Vol. 231 (2006)

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Bertrand, P., & Delcorte, A. (2006). Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity. American Chemical Society. Abstracts of Papers (at the National Meeting), 231. https://hdl.handle.net/2078.5/82412 (Original work published 2006)