Theoretical Considerations for Sram Total-dose Hardening
(1995) IEEE Transactions on Nuclear Science — Vol. 42, n° 2, p. 83-91 (1995)
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- Abstract
- The theoretical hardness against total dose of the six-transistor SRAM cell is investigated in detail. An explicit analytical expression of the maximum tolerable threshold voltage shift is derived for two cross-coupled inverters, A numerical method is used to explore the hardness of the read and write operations, Both N- and P-channel access transistors designs are considered and their respective advantages are compared. The study points out that the radiation hardness mainly relies on the technology. Results obtained with the very robust Gate-All-Around process are finally presented.
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Francis, P., Flandre, D., & Colinge, J.-P. (1995). Theoretical Considerations for Sram Total-dose Hardening. IEEE Transactions on Nuclear Science, 42(2), 83-91. https://doi.org/10.1109/23.372136 (Original work published 1995)