Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles
(2011) Surface and Interface Analysis — Vol. 43, n° 1-2, p. 70-73 (2011)
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- Abstract
- In recentexperiments involving metal-assisted secondaryionmassspectrometry (MetA-SIMS),eitheranincreaseoradecreaseof the sputtered organic ion yield was demonstrated dependingwhether the incoming projectile was atomic (Ga, In) or polyatomic (Bi3, C60). Theoretically, the electronic and molecular processes governing the yield variation are still poorly understood for metal-organic surfaces. To unravel the physics of sputtering, molecular dynamics simulations involvingmetal-organic samples have been implemented. Two targets mimicking, respectively, a gold/organic vertical interface and amolecular sample covered by gold nanoparticles were designed and bombarded with several projectiles, including Ga and C60. The results emphasize the differences of emission and molecular mechanisms induced by these projectiles and explain some of the effects observed in MetA-SIMS.
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Citations
Restrepo-Gutiérrez, O. A., & Delcorte, A. (2011). Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles. Surface and Interface Analysis, 43(1-2), 70-73. https://doi.org/10.1002/sia.3411 (Original work published 2011)