On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: successes and limitation

Sellier, H.;Hackens, Benoît;Pala, M.G.;Martins, F.M.;Huant, S.;et.al.
(2011) Semiconductor Science and Technology — Vol. 26:6, n° 064008 (2011) (2011)

Files

SST_published.pdf
  • Restricted Access
  • Adobe PDF
  • 1.07 MB

Details

Authors
Show more
Affiliations

Citations

Sellier, H., Hackens, B., Pala, M. G., Martins, F. M., Baltazar, S., Wallart, X., Desplanque, L., Bayot, V., & Huant, S. (2011). On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: successes and limitation. Semiconductor Science and Technology, 26:6(064008 (2011)). https://hdl.handle.net/2078.5/69450 (Original work published 2011)