ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers

Delcorte, Arnaud;Bertrand, Patrick;Wischerhoff, Erik;Laschewsky, André
(1998) Secondary Ion Mass Spectrometry: SIMS XI — ISBN: [0-471-97826-4], p. 533-536, published

Files

No attached file found for this publication.

Details

Authors
  • Delcorte, ArnaudUCLouvain
    Author
  • Bertrand, PatrickUCLouvain
    Author
  • Wischerhoff, ErikUCLouvain
    Author
  • Laschewsky, AndréUCLouvain
    Author
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Delcorte, A., Bertrand, P., Wischerhoff, E., & Laschewsky, A. (1998). ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers. In G. Gillen, R. Lareau, J. Bennett, F. Stevie (ed.), Secondary Ion Mass Spectrometry: SIMS XI (p. p. 533-536). John Wiley & Sons Publs. https://hdl.handle.net/2078.5/66844