Invited talk : Cluster-induced sputtering: Microscopic models and universal velocity dependences

(2013) 19th International Conference on Secondary Ion Mass Spectrometry (SIMS XIX), (September 2013). — Location: Jeju (Korea) (September.2013)

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Delcorte, A. (2013). Invited talk : Cluster-induced sputtering: Microscopic models and universal velocity dependences. 19th International Conference on Secondary Ion Mass Spectrometry (SIMS XIX), (September 2013)., Jeju (Korea). https://hdl.handle.net/2078.5/47188