Scanning Gate Microscopy images the electronic LDOS inside nanostructures

Huant, S.;Rodrigues Martins, Frederico;Pala, M. G.;Hackens, Benoît;Bayot, Vincent;et.al.
(2008) 11th Int. Conf. Non-Contact Atomic Force Microscopy — Location: Madrid, Spain

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  • Huant, S.CNRS, Grenoble
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  • Rodrigues Martins, FredericoCNRS, Grenoble
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  • Pala, M. G.Minatec, Grenoble
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  • Hackens, BenoîtUCLouvain
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  • Bayot, VincentUCLouvain
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Huant, S., Rodrigues Martins, F., Pala, M. G., Hackens, B., Ouisse, T., Sellier, H., & Bayot, V. (2008). Scanning Gate Microscopy images the electronic LDOS inside nanostructures. 11th Int. Conf. Non-Contact Atomic Force Microscopy, Madrid, Spain. https://hdl.handle.net/2078.5/44513