ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission (vol 381, pg 18, 1997)
(1997) Surface Science — Vol. 389, n° 1-3, p. 393-394 (1997)
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Delcorte, A., Segda, B., & Bertrand, P. (1997). ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission (vol 381, pg 18, 1997). Surface Science, 389(1-3), 393-394. https://doi.org/10.1016/S0039-6028(97)00468-8 (Original work published 1997)