Impact of Radiations on CMOS-MEMS Sensors and a Mitigation TechniqueFrancis, Laurent;André, Nicolas;Amor, Sedki;Gérard, Pierre;Udrea, Florin;et.al.(2016) Emerging Technologies CMOS 2016 — Location: Montréal (Canada) (25.May.2016)
FilesImpactofRadiationsonCMOS-MEMSSensorsandaMitigationTechnique.pdf Closed Access Adobe PDF1.84 MBRequest a copyDetailsAuthorsFrancis, LaurentUCLouvainAuthorAndré, NicolasUCLouvainAuthorAmor, SedkiUCLouvainAuthorGérard, PierreUCLouvainAuthorFlandre, DenisUCLouvainAuthorUdrea, FlorinUniversity of cambridge, United KingdomAuthorShow more AffiliationsUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueShow moreCitations APA Chicago FWB Francis, L., André, N., Amor, S., Gérard, P., Flandre, D., & Udrea, F. (2016). Impact of Radiations on CMOS-MEMS Sensors and a Mitigation Technique. Emerging Technologies CMOS 2016, Montréal (Canada). https://hdl.handle.net/2078.5/272158