Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle

Delhaye, Thibault;Roisin, Nicolas;André, Nicolas;Francis, Laurent;Flandre, Denis
(2021) IEEE Sensors 2021 — Location: virtual conference (31.October.2021)

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Delhaye, T., Roisin, N., André, N., Francis, L., & Flandre, D. (2021). Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle. Proceedings of the IEEE Sensors 2021. IEEE Sensors 2021, virtual conference. https://hdl.handle.net/2078.5/272121