UNSURE: self-supervised learning with Unknown Noise level and Stein's Unbiased Risk Estimate

Tachella, Julián;Davies, Mike;Jacques, Laurent
(2025) 13th International Conference on Learning Representations (ICLR 2025) — Location: Singapore (24.April.2025)

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Abstract
Recently, many self-supervised learning methods for image reconstruction have been proposed that can learn from noisy data alone, bypassing the need for ground-truth references. Most existing methods cluster around two classes: i) Stein's Unbiased Risk Estimate (SURE) and similar approaches that assume full knowledge of the noise distribution, and ii) Noise2Self and similar cross-validation methods that require very mild knowledge about the noise distribution. The first class of methods tends to be impractical, as the noise level is often unknown in real-world applications, and the second class is often suboptimal compared to supervised learning. In this paper, we provide a theoretical framework that characterizes this expressivity-robustness trade-off and propose a new approach based on SURE, but unlike the standard SURE, does not require knowledge about the noise level. Throughout a series of experiments, we show that the proposed estimator outperforms other existing self-supervised methods on various imaging inverse problems.
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Tachella, J., Davies, M., & Jacques, L. (2025). UNSURE: self-supervised learning with Unknown Noise level and Stein’s Unbiased Risk Estimate. 13th International Conference on Learning Representations (ICLR 2025). Published. 13th International Conference on Learning Representations (ICLR 2025), Singapore.