Investigation of the Electrical Detection of hybridized DNA Concentrations lower Than 1 nM, based On CMOS Compatible Al Capacitors Coated With Metal Oxides
(2005) 2nd ERBM Workshop — Location: Urbana-Champaign University (USA) (7.September.2005)
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Pampin, Rémi 
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Moreno Hagelsieb, L., Pampin, R., Laurent, G., Raskin, J.-P., Poleunis, C., Bertrand, P., Flandre, D., Foultier, B., & Remacle, J. (2005). Investigation of the Electrical Detection of hybridized DNA Concentrations lower Than 1 nM, based On CMOS Compatible Al Capacitors Coated With Metal Oxides. Proceedings of the 2nd ERBM Workshop. Published. 2nd ERBM Workshop, Urbana-Champaign University (USA). https://hdl.handle.net/2078.5/254613