UTBB FDSOI and SOI FinFET device assessment for future analog/RF applications
(2012) 2012 IEEE International SOI Conference — Location: Napa (USA) (1.October.2012)
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Kilchytska, V., Raskin, J.-P., & Flandre, D. (2012). UTBB FDSOI and SOI FinFET device assessment for future analog/RF applications. 2012 IEEE International SOI Conference, Napa (USA). https://hdl.handle.net/2078.5/253457