A Compact Model for Single Event Effects in PD SOI sub-micron MOSFETs

Alvarado, Jose Joaquin;Boufouss, El Hafed;Kilchytska, Valeriya;Flandre, Denis
(2011) Conference on Radiation Effetcs on Components and Systems (RADECS) — Location: Séville (Espagne) (19.September.2011)

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Alvarado, J. J., Boufouss, E. H., Kilchytska, V., & Flandre, D. (2011). A Compact Model for Single Event Effects in PD SOI sub-micron MOSFETs. Proceedings of the Conference on Radiation Effects on Components and Systems (RADECS 2011), 7. https://hdl.handle.net/2078.5/253450