Characterization of Quantum Efficiency and Effective Lifetime in Thin Ungated SOI Lateral PIN Photodiodes in the UV-Range

Afzalian, Aryan;Torfs, T.;Van hoof, C.;Flandre, Denis
(2006) Eurosoi 2006 Second Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits — Location: Grenoble (France) (8.March.2006)

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  • Afzalian, AryanUCLouvain
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  • Torfs, T.IMEC
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  • Van hoof, C.IMEC
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  • Flandre, DenisUCLouvain
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Afzalian, A., Torfs, T., Van hoof, C., & Flandre, D. (2006). Characterization of Quantum Efficiency and Effective Lifetime in Thin Ungated SOI Lateral PIN Photodiodes in the UV-Range. Eurosoi 2006 Conference Proceedings, 67-68. https://hdl.handle.net/2078.5/253427