Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers
(2017) MOS-AK Workshop — Location: Leuven (Belgium) (11.September.2017)
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Measurementandmodellingofspecificbehaviorsin28nmFDSOIUTBBMOSFETsofimportanceforanalog-RFamplifiers.pdf
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Flandre, D., Kilchytska, V., Gimeno Gasca, C., Bol, D., Kazemi Esfeh, B., & Raskin, J.-P. (2017). Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers. MOS-AK Workshop, Leuven (Belgium). https://hdl.handle.net/2078.5/253387