Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits

Flandre, Denis;Kilchytska, Valeriya;Alvarado Pulido, José Joaquin;Boufouss, El Hafed;Francis, Laurent;et.al.
(2011) 2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011) — Location: Ghent (Belgium) (6.June.2011)

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Flandre, D., Kilchytska, V., Alvarado Pulido, J. J., Boufouss, E. H., Assaad, M., Rue, B., Roda Neve, C., Raskin, J.-P., & Francis, L. (2011). Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits. 2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011), Ghent (Belgium). https://hdl.handle.net/2078.5/253370