Multi-gate MOSFET behavior at high temperatures
(2007) EUROSOI 2007 — Location: Leuven (Belgium) (24.January.2007)
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IMEC Ukraine National Academy of Science Institute of Semiconductor Physics
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Kilchytska, V., Collaert, N., Jurczak, M., & Flandre, D. (2007). Multi-gate MOSFET behavior at high temperatures. Conference proceedings of EUROSOI 2007. EUROSOI 2007, Leuven (Belgium). https://hdl.handle.net/2078.5/253363