High-temperature analog instrumentation system in thin-film fully-depleted SOI CMOS technology
(1998) Fourth International High Temperature Conference (HITEC 1998) — Location: Albuquerque (USA) (14.June.1998)
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- Abstract
- The feasibility of single chip solutions fully integrating complete analog instrumentation system using thin-film fully-depleted SOI CMOS technology is demonstrated. The performance of our instrumentation amplifiers, continuous-time filters and sigma-delta modulators are compatible with actual specifications from oil drilling or aerospace applications and correct operation is extended up to more than 300°C.
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Citations
Demeûs, L., Viviani, A., & Flandre, D. (1998). High-temperature analog instrumentation system in thin-film fully-depleted SOI CMOS technology. Proceedings of the Fourth International High Temperature Conference (HITEC 1998), 51-54. https://doi.org/10.1109/HITEC.1998.676760