Analysis and future trends of Iddq testing for silicon on insulator CMOS ICs

Iniguez, Benjamin;Raskin, Jean-Pierre;Simon, Pascal;Flandre, Denis;Segura, J.
(2001) 2001 IEEE International Workshop on Current and Defect Based Testing (DBI′2001) — Location: Los Angeles (USA) (29.April.2001)

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Iniguez, B., Raskin, J.-P., Simon, P., Flandre, D., & Segura, J. (2001). Analysis and future trends of Iddq testing for silicon on insulator CMOS ICs. Proceedings of the 2001 IEEE International Workshop on Current and Defect Based Testing (DBI′2001), 40-44. https://hdl.handle.net/2078.5/253243