Electrical characterization of FinFETs: Special aspects
(2006) 7th Symposium Diagnostics & Yield: Advanced Silicon Devices and Technologies for ULSI Era — Location: Warszawa (Poland) (26.June.2006)
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Lashkaryov Institute of Semiconductor Physics (ISP), Kyiv
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Kilchytska, V., Rudenko, T., & Flandre, D. (2006). Electrical characterization of FinFETs: Special aspects. Proceedings of the 7th Symposium Diagnostics & Yield: Advanced Silicon Devices and Technologies for ULSI Era. 7th Symposium Diagnostics & Yield: Advanced Silicon Devices and Technologies for ULSI Era, Warszawa (Poland). https://hdl.handle.net/2078.5/253224