Characterization and high-level modeling of SOI ring oscillators under irradiation
(2000) European Conference on Radiation Effects on Components and Systems (RADECS 2000) — Location: Louvain-la-Neuve (Belgium) (11.September.2000)
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Martinez, I., Delatte, P., Berger, G., & Flandre, D. (2000). Characterization and high-level modeling of SOI ring oscillators under irradiation. Proceedings of the European Conference on Radiation Effects on Components and Systems (RADECS 2000), 205-208. https://hdl.handle.net/2078.5/253159