Impact of temperature reduction and channel engineering on the linearity of FD SOI nMOSFETs
(2009) EUROSOI Conference 2009 — Location: Göteborg (Sweden) (19.January.2009)
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- Affiliations
Centro Universitário da FEI Department of Electrical Engineering IMEC K.U.Leuven E.E. Department
Citations
de Souza, M., Flandre, D., Martino, J. A., Simoen, E., Claeys, C., & Pavanello, M. A. (2009). Impact of temperature reduction and channel engineering on the linearity of FD SOI nMOSFETs. Proceedings of the EUROSOI Conference 2009. EUROSOI Conference 2009, Göteborg (Sweden). https://hdl.handle.net/2078.5/253151