SOI DevicesColinge, Jean-Pierre;Flandre, Denis(2008) IEEE International SOI conference: SOI Fundamentals Class — Location: New Paltz, New York (USA) (8.October.2008)
FilesNo attached file found for this publication.DetailsAuthorsColinge, Jean-PierreUCLouvainAuthorFlandre, DenisUCLouvainAuthorAffiliationsUCLouvainFSA/ELEC - Département d'électricitéShow moreCitations APA Chicago FWB Colinge, J.-P., & Flandre, D. (2008). SOI Devices. IEEE International SOI conference: SOI Fundamentals Class, New Paltz, New York (USA). https://hdl.handle.net/2078.5/253143