High-Temperature Accurate Characterization of SOI Bipolar/Diode Devices for their Applications in Precise High-Order Bandgap References

Adriaensen, Stéphane;Flandre, Denis
(2003) 2003 International Conference on High-Temperature Electronics (HITEN 2003) — Location: Oxford (United Kingdom) (8.July.2003)

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Adriaensen, S., & Flandre, D. (2003). High-Temperature Accurate Characterization of SOI Bipolar/Diode Devices for their Applications in Precise High-Order Bandgap References. In Johnston C., Vermessan O., Crossley A. (ed.), Proceedings of the 2003 International Conference on High-Temperature Electronics (HITEN 2003) (pp. 133-140). https://hdl.handle.net/2078.5/253134