Direct MOSFET Parameters Extraction Using Fourier-Space Techniques
(2004) Fifth International Caracas Conference on Devices, Circuits and Systems — Location: Dominican Republic (3.November.2004)
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- Abstract
- A new MOSFET parameter extraction tool is presented. This tool uses digital signal processing techniques to increase the signal/noise ratio within well-known extraction methods based on determining maxima of derivatives. This signal processing is related with calculations based on Fourier transform and filtering procedures to smooth data. The procedure is applied to extract three different parameters, and results are compared with other methods using experimental data.
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Citations
Picos, R., Roca, M., Iniguez, B., Bellodi, M., Flandre, D., & Garcia-Moreno, E. (2004). Direct MOSFET Parameters Extraction Using Fourier-Space Techniques. Proceedings of the Fifth International Caracas Conference on Devices, Circuits and Systems, 9-13. https://doi.org/10.1109/ICCDCS.2004.1393344