Assessment of advanced SOI technologies for high-temperature applications
(2009) 8th Edition of the Diagnostics and Yield Symposium — Location: Warsaw (Poland) (22.June.2009)
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Alvarado Pulido, J. J., Kilchytska, V., & Flandre, D. (2009). Assessment of advanced SOI technologies for high-temperature applications. Proceedings of the 8th Edition of the Diagnostics and Yield Symposium. 8th Edition of the Diagnostics and Yield Symposium, Warsaw (Poland). https://hdl.handle.net/2078.5/253118