Recombination current and carrier lifetime extraction in dual-gate fully depleted SOI devices

Ernst, Thomas;Cristoloveanu, Sorin;Vandooren, Anne;Colinge, Jean-Pierre;Flandre, Denis
(1998) 28th European Solid-State Research Conference (ESSDERC 1998) — Location: Bordeaux (France) (22.September.1998)

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  • Ernst, ThomasLaboratoire d'Electronique et de Technologie de l'Information, Grenoble
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  • Cristoloveanu, SorinIMEP, Grenoble
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  • Vandooren, AnneUCLouvain
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  • Colinge, Jean-PierreUCLouvain
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  • Flandre, DenisUCLouvain
    Author
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