Comparison of Graded-Channel and Self-Cascode SOI MOS Transistors
(2003) 4ª Conferencia de Dispositivos Electrónicos (CDE-2003) — Location: Calella de la Costa - Barcelona (Spain) (12.February.2003)
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Sanz, M. T., Celma, S., Calvo, B., & Flandre, D. (2003). Comparison of Graded-Channel and Self-Cascode SOI MOS Transistors. Proceedings of the 4ª Conferencia de Dispositivos Electrónicos (CDE-2003), II-11. https://hdl.handle.net/2078.5/253022