Charge injection characterization of thin-film SOI MOS transistors at high temperature
(2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Location: Washington, DC (USA) (25.March.2001)
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Picun, G., Demeûs, L., & Flandre, D. (2001). Charge injection characterization of thin-film SOI MOS transistors at high temperature. Electrochemical Society. Proceedings, 115-120. https://hdl.handle.net/2078.5/253015