Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits

Alvarado Pulido, José Joaquin;Kilchytska, Valeriya;Boufouss, El Hafed;Flandre, Denis
(2010) EUROSOI 2010 — Location: Grenoble (France) (25.January.2010)

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Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits
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Alvarado Pulido, J. J., Kilchytska, V., Boufouss, E. H., & Flandre, D. (2010). Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits. Proceedings of EUROSOI 2010. EUROSOI 2010, Grenoble (France). https://hdl.handle.net/2078.5/252989