Testing SOI CMOS IC's with Parametric Testing Methods: a Fundamental Analysis
(2001) XVI Conference on Design of Circuits and Integrated Systems (DCIS 2001) — Location: Porto (Portugal) (20.November.2001)
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Iniguez, B., Raskin, J.-P., Simon, P., Flandre, D., & Segura, J. (2001). Testing SOI CMOS IC’s with Parametric Testing Methods: a Fundamental Analysis. Proceedings of the XVI Conference on Design of Circuits and Integrated Systems (DCIS 2001), 636-640. https://hdl.handle.net/2078.5/252944