Fabrication, electrical characterization and scanning gate microscopy of Schottky silicon nanowire devices
(2013) APS March Meeting — Location: Baltimore (USA) (18.March.2013)
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FabricationelectricalcharacterizationandscanninggatemicroscopyofSchottkysiliconnanowiredevices.pdf
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Melinte, S., Iordanescu, A.-G., Dutu, C. A., Flandre, D., Faniel, S., Rodrigues Martins, F., & Hackens, B. (2013). Fabrication, electrical characterization and scanning gate microscopy of Schottky silicon nanowire devices. Bulletin of the American Physical Society, 1. https://hdl.handle.net/2078.5/252937