Characterization and Modeling of Single Event transients in LDMOS-SOI technology

Alvarado Pulido, José Joaquin;Kilchytska, Valeriya;Flandre, Denis
(2009) MOS-AK/ESSDERC/ESSCIRC Workshop 2009 — Location: Athens (Greece) (14.September.2009)

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Alvarado Pulido, J. J., Kilchytska, V., & Flandre, D. (2009). Characterization and Modeling of Single Event transients in LDMOS-SOI technology. Proceedings of the MOS-AK/ESSDERC/ESSCIRC Workshop 2009. MOS-AK/ESSDERC/ESSCIRC Workshop 2009, Athens (Greece). https://hdl.handle.net/2078.5/252804