Wide Frequency Band Characterization
(2010) Nanoscale CMOS: Innovative Materials, Modeling and Characterization — 672 pages, published
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Kilchytska, V., Flandre, D., & Raskin, J.-P. (2010). Wide Frequency Band Characterization. In Francis Balestra (eds) (ed.), Nanoscale CMOS: Innovative Materials, Modeling and Characterization (p. 672 pages). Wiley-ISTE. https://doi.org/10.1002/9781118621523.ch17