Assessment of advanced SOI CMOS technologies for high-temperature applications
(2007) The International Conference on High Temperature Electronics (HITEN 2007) — Location: Oxford (Royaume-Uni) (17.September.2007)
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Kilchytska, V., & Flandre, D. (2007). Assessment of advanced SOI CMOS technologies for high-temperature applications. Proceedings of the International Conference on High Temperature Electronics (HITEN 2007). The International Conference on High Temperature Electronics (HITEN 2007), Oxford (Royaume-Uni). https://hdl.handle.net/2078.5/252764