Analysis of matching in graded-channel SOI MOSFETs
(2007) 22nd Symposium on Microelectronics Technology and Devices (SBMicro 2007) — Location: Rio de janeiro (Brazil) (3.September.2007)
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Centro Universitário da FEI Department of Electrical Engineering
Citations
de Souza, M., Pavanello, M. A., & Flandre, D. (2007). Analysis of matching in graded-channel SOI MOSFETs. Proceedings of the 22nd Symposium on Microelectronics Technology and Devices (SBMicro 2007). 22nd Symposium on Microelectronics Technology and Devices (SBMicro 2007), Rio de janeiro (Brazil). https://hdl.handle.net/2078.5/252761